发明名称 Sidewall structure for metal interconnect and method of making same
摘要 Disclosed is an integrated circuit structure having one or more metal lines thereon with metal line sidewall retention structures formed on the sides of the metal lines. The metal line sidewall retention structures comprise a material sufficiently hard to inhibit lateral distortion or expansion of portions of the metal line during subsequent processing or use of the metal line. The metal line sidewall retention structures are formed by anisotropically etching a layer of a material sufficiently hard to inhibit lateral distortion or expansion of portions of the metal line after formation of a layer of such a material over and around the sides of the metal lines.
申请公布号 US6303995(B1) 申请公布日期 2001.10.16
申请号 US19960586587 申请日期 1996.01.11
申请人 LSI LOGIC CORPORATION 发明人 KAPOOR ASHOK K.;CHOUDHURY RATAN K.
分类号 H01L21/3205;H01L21/28;H01L21/768;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/3205
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