发明名称 METHOD OF FORMING DIELECTRIC FILM
摘要 PROBLEM TO BE SOLVED: To improve uniformity in a dielectric film and control the composition along the thickness direction of the dielectric film by eliminating incubation time in forming the dielectric film by a CVD method on a Si substrate surface, that is covered by a thin molecular layer of an insulator. SOLUTION: The CVD process for forming the dielectric film starts, after a vapor-phase molecular compound of a metal element that constitutes the dielectric film, is made to adsorb uniformly on the molecular layer of the insulator and is oxidized to form a dielectric molecular layer.
申请公布号 JP2001284344(A) 申请公布日期 2001.10.12
申请号 JP20000095818 申请日期 2000.03.30
申请人 TOKYO ELECTRON LTD 发明人 KIRYU HIDEKI;AOYAMA SHINTARO;TAKAHASHI TAKESHI;JINRIKI HIROSHI
分类号 C23C16/02;C23C16/40;C23C16/44;C23C16/455;H01L21/02;H01L21/28;H01L21/316;H01L29/51;H01L29/78;(IPC1-7):H01L21/316 主分类号 C23C16/02
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