发明名称 |
METHOD OF FORMING DIELECTRIC FILM |
摘要 |
PROBLEM TO BE SOLVED: To improve uniformity in a dielectric film and control the composition along the thickness direction of the dielectric film by eliminating incubation time in forming the dielectric film by a CVD method on a Si substrate surface, that is covered by a thin molecular layer of an insulator. SOLUTION: The CVD process for forming the dielectric film starts, after a vapor-phase molecular compound of a metal element that constitutes the dielectric film, is made to adsorb uniformly on the molecular layer of the insulator and is oxidized to form a dielectric molecular layer.
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申请公布号 |
JP2001284344(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000095818 |
申请日期 |
2000.03.30 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KIRYU HIDEKI;AOYAMA SHINTARO;TAKAHASHI TAKESHI;JINRIKI HIROSHI |
分类号 |
C23C16/02;C23C16/40;C23C16/44;C23C16/455;H01L21/02;H01L21/28;H01L21/316;H01L29/51;H01L29/78;(IPC1-7):H01L21/316 |
主分类号 |
C23C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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