发明名称 SOLUTION MATERIAL FOR UNDERLAYER FILM AND PATTERN FORMING METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a solution material for an underlayer film having etching resistance and an antistatic effect and capable of forming a film by a coating method, and a pattern forming method using the solution material. SOLUTION: The solution material contains at least one selected from the group comprising organic compounds each having >=85 wt.% carbon content per one molecule and metallic compounds and a surfactant. The pattern forming method has a step for forming an underlayer film on a film to be worked by coating the top of the film to be worked with the solution material, a step for forming a resist film on the underlayer film and a step for forming a resist pattern by patternwise exposing the resist film.
申请公布号 JP2001272788(A) 申请公布日期 2001.10.05
申请号 JP20000085109 申请日期 2000.03.24
申请人 TOSHIBA CORP 发明人 SATO YASUHIKO;ONISHI KIYONOBU
分类号 G03F7/11;G03F7/004;H01L21/027 主分类号 G03F7/11
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