发明名称 MASS SPECTROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a mass spectroscope for sensitively measuring accurate molecular weights of detected gases and sensitively analyzing the molecular structures. SOLUTION: This mass spectroscope is provided with a mass spectrometry mechanism for allowing a mass spectrometry on ionized detected gases, and is separately equipped with a first ion source 11 for attaching positive metal ions to ionize and a second ion source 17 for giving the impact of electrons to ionize. This structure allows measurement of molecular weights of detected gases and analysis of the molecular structures to be performed simultaneously or separately, with high sensitivity. The second ion source is positioned between the first ion source and the mass spectrometry mechanism, and the detected gases are introduced into the first ion source.
申请公布号 JP2001273869(A) 申请公布日期 2001.10.05
申请号 JP20000085394 申请日期 2000.03.24
申请人 ANELVA CORP 发明人 SHIOKAWA YOSHIRO;NAKAMURA MEGUMI;FUJII TOSHIHIRO
分类号 G01N27/62;H01J49/10;H01J49/14;H01J49/24;H01J49/42;(IPC1-7):H01J49/10 主分类号 G01N27/62
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