发明名称 Thin film phase plate, phase contrast electron microscope with a thin film phase plate and method for preventing the charging of the phase plate increases contrast in electron microscope images while removing image distortion.
摘要 If charged, a phase plate's effect is minimized to increase contrast in a resulting electron microscope image and to remove image distortion. The plate has a thin amorphous carbon and gold or composite conductive film (2) on a microscope's lens screen (1) to adjust the phases of scattered electron waves appearing. In the centre of the lens screen's opening there is a totally circular microscopic electron through hole (3) with a size between 0.05 and 5 mu m.
申请公布号 DE10114949(A1) 申请公布日期 2001.10.04
申请号 DE20011014949 申请日期 2001.03.27
申请人 JEOL LTD., TOKIO/TOKYO 发明人 NAGAYAMA, KUNIAKI;DANEV, RADOSTIN S.
分类号 G02B5/30;H01J37/22;H01J37/28;H01J37/29;(IPC1-7):H01J37/153;H01J37/09 主分类号 G02B5/30
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