发明名称 |
Thin film phase plate, phase contrast electron microscope with a thin film phase plate and method for preventing the charging of the phase plate increases contrast in electron microscope images while removing image distortion. |
摘要 |
If charged, a phase plate's effect is minimized to increase contrast in a resulting electron microscope image and to remove image distortion. The plate has a thin amorphous carbon and gold or composite conductive film (2) on a microscope's lens screen (1) to adjust the phases of scattered electron waves appearing. In the centre of the lens screen's opening there is a totally circular microscopic electron through hole (3) with a size between 0.05 and 5 mu m.
|
申请公布号 |
DE10114949(A1) |
申请公布日期 |
2001.10.04 |
申请号 |
DE20011014949 |
申请日期 |
2001.03.27 |
申请人 |
JEOL LTD., TOKIO/TOKYO |
发明人 |
NAGAYAMA, KUNIAKI;DANEV, RADOSTIN S. |
分类号 |
G02B5/30;H01J37/22;H01J37/28;H01J37/29;(IPC1-7):H01J37/153;H01J37/09 |
主分类号 |
G02B5/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|