发明名称 Subsurface mapping apparatus and method
摘要 A method is provided for detecting and locating anomalies in soil subjacent to an existing structure. Electrodes are placed into the soil both outside the structure and through the structure's foundation. Electrical resistivity data is collected using these electrodes. This electrical resistivity data is analyzed to create an electrical resistivity map or model. Inspection of the map or model can allow the operator to detect and locate resistivity anomalies which may correspond to geological anomalies in the soil. In alternative embodiment, one or more soil samples are taken from the soil adjacent to the existing structure. Laboratory resistivity measurements are performed on the soil samples to provide a set of baseline resistivity data. A resistivity map or model is produced as described above. This resistivity map or model is compared to the baseline values provided by the laboratory resistivity measurements of the soil samples to detect and locate resistivity and geological anomalies. Moreover, comparison of the resistivity model with the actual soil sample resistivity baseline allows the operator to more accurately detect subsurface anomalies by minimizing the problem of non-uniqueness and allowing the operator to disregard outlying data.
申请公布号 US6295512(B1) 申请公布日期 2001.09.25
申请号 US19980071577 申请日期 1998.05.01
申请人 BRYANT JOHN 发明人 BRYANT JOHN
分类号 G01V3/02;(IPC1-7):G01V3/02 主分类号 G01V3/02
代理机构 代理人
主权项
地址