发明名称
摘要 A high-voltage signal detecting circuit for use in a semiconductor memory device includes a signal transfer section having first nMOSFET, pMOSFET, second nMOSFET and third nMOSFET serially connected together in this order from a first input terminal to a ground line. The gates of pMOSFET and second and third nMOSFETs are connected to a second input terminal for receiving the supply source potential. A discharge transistor is connected between the first node which connects the pMOSFET and second nMOSFET together and the ground line, to discharge electric charge from the first node before application of the source potential. The discharge section provides a high-speed start-up of the memory device.
申请公布号 JP3211881(B2) 申请公布日期 2001.09.25
申请号 JP19980163378 申请日期 1998.06.11
申请人 发明人
分类号 G01R31/28;G01R19/165;G01R31/3185;G11C11/401;G11C29/00;G11C29/14;H01L23/52;H01L27/02;(IPC1-7):G11C29/00;G01R31/318 主分类号 G01R31/28
代理机构 代理人
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