| 摘要 |
An apparatus and a corresponding method for determining a spatial relationship between a surface provided with a predetermined pattern and the apparatus are disclosed. A part of the surface is imaged in the apparatus, after which the image is compared with the predetermined pattern. The comparison produces at least one reference measurement, by means of which it is possible to determine the spatial relationship expressed in at least the parameters which define the orientation of the surface. By using knowledge of the predetermined pattern together with an algebraic model of the image formation by the apparatus, a numerical adaptation can be carried out. Parameters obtained from the adaptation can then be used to calculate the spatial relationship between the apparatus and the surface in terms of, for example, a distance between the apparatus and the surface or an angle between the surface and an axis extending through the apparatus. |
