| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device for solid-state image pickup device that can enhance measurement accuracy, without incurring increase in measurement time. SOLUTION: The inspection device for solid-state image pickup device is provided with a plurality of measurement circuits MEM1, etc., that measure levels of pixel signals S1 outputted form a solid-state image pickup device CCD, at the same time and with an arithmetic circuit section ADA that calculates a mean value of a plurality of measured values outputted in parallel from a plurality of the measurement circuits to inspect the propriety of the solid-state image pickup device, on the basis of a mean value output outputted form the arithmetic circuit section ADA. |
