| 摘要 |
PROBLEM TO BE SOLVED: To perform evaluation between a storage control part and a storage part before a device is completed and to eliminate the need of a dedicated tester since a test between the storage control part and the storage part can not be performed until the device or the dedicated tester is completed and man-hour is required for dedicated tester development including debugging or the like. SOLUTION: The storage control part is provided with a control circuit for switching a normal logic part and storage part evaluation logic. Test data for electric system evaluation and storage part control are performed by setting enable signals, activation signals and mode signals from the outside. A dip switch or the like is used for setting. In this test system, since the control of an operation/non-operation for storage part evaluation, addresses and data are easily supplied by using the dip switch or the like, the need of activation from the higher order of the storage device is eliminated. Thus, the test is performed in the environment of only the storage device and the need of the dedicated tester is eliminated. |
