发明名称 METHOD OF PLASMA TREATMENT
摘要 PROBLEM TO BE SOLVED: To prevent deterioration of the characteristics of a device by reducing the metal contamination of a semiconductor substrate after a plasma treatment. SOLUTION: After the semiconductor substrate is etched, Fe and Cr contaminants adhering to the surface of the substrate are removed by exposing the substrate to a plasma of chlorine gas or a mixed gas of chlorine and oxygen.
申请公布号 JP2001250813(A) 申请公布日期 2001.09.14
申请号 JP20000065698 申请日期 2000.03.06
申请人 HITACHI LTD 发明人 YAKUSHIJI MAMORU;NAWATA MAKOTO
分类号 H05H1/46;C23F4/00;H01L21/302;H01L21/3065 主分类号 H05H1/46
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