发明名称 THICKNESS MEASURING METHOD OF BASE METAL HAVING FILM- LIKE DEPOSIT LAYER SUCH AS PAINTED FILM OR RUST AND APPARATUS THEREFOR AND MAINTENANCE METHOD OF FILM DEPOSIT DEVICE SUCH AS DUST COLLECTOR
摘要 PROBLEM TO BE SOLVED: To provide a thickness measuring method of base metal and an appara tus therefor which enable measurement of the base metal alone without physical peeling of a film-like deposit layer in a metal member formed by adhering the film-like deposit layer such as painted film or rust on to both sides of the base metal and a maintenance method using a metal thickness measuring appara tus which enables measurement of the thickness of the base metal for apparatus es and material whose component material is the base metal of the film deposit device such as dust collector by determining the thickness of the film-like deposit layer and that of the metal member. SOLUTION: A portable measuring apparatus for measuring the thickness of base metal having a film-like deposit layer such as painted film or rust in the first of this invention is constituted of a sensor head 10 having a sensor for measuring the thickness of the film-like deposit layer and a sensor for measuring the thickness of the metal member, a controller 25 for computing the thickness of the base metal and an upper level processing part 31.
申请公布号 JP2001249017(A) 申请公布日期 2001.09.14
申请号 JP20000062275 申请日期 2000.03.07
申请人 MITSUBISHI HEAVY IND LTD 发明人 IKEGAMI YASUHIKO;ITO SUMIO;MOTO MASAMITSU;YATABE HIROSHI;HIRAI TAKAHIKO
分类号 G01B21/08;(IPC1-7):G01B21/08 主分类号 G01B21/08
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