发明名称 |
METHOD FOR FORMING ISOLATION REGION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming an isolation region of a semiconductor device is provided to prevent the bird's beak and reduce the line width of a field region by forming a trench and a device separation film in forming a spacer. CONSTITUTION: A pad oxide film(102) and a silicon nitride film(104) are formed on a semiconductor substrate(100). By patterning the pad oxide film(102) and the silicon nitride film(104) in succession, isolation patterns having a predetermined pitch are formed. The width of the pitch is from 0.2 micrometer to 0.6 micrometer. A spacer membrane is formed on the whole semiconductor substrate(100) including the isolation patterns. A spacer is formed on both sidewalls of the isolation patterns by etching, and a trench is formed between the isolation patterns. An oxide film is grown to fill up the trench, so that an isolation region is formed.
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申请公布号 |
KR20010086520(A) |
申请公布日期 |
2001.09.13 |
申请号 |
KR20000010445 |
申请日期 |
2000.03.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, JIN HO;CHO, IN SU |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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主权项 |
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地址 |
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