发明名称 METHOD FOR FORMING ISOLATION REGION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming an isolation region of a semiconductor device is provided to prevent the bird's beak and reduce the line width of a field region by forming a trench and a device separation film in forming a spacer. CONSTITUTION: A pad oxide film(102) and a silicon nitride film(104) are formed on a semiconductor substrate(100). By patterning the pad oxide film(102) and the silicon nitride film(104) in succession, isolation patterns having a predetermined pitch are formed. The width of the pitch is from 0.2 micrometer to 0.6 micrometer. A spacer membrane is formed on the whole semiconductor substrate(100) including the isolation patterns. A spacer is formed on both sidewalls of the isolation patterns by etching, and a trench is formed between the isolation patterns. An oxide film is grown to fill up the trench, so that an isolation region is formed.
申请公布号 KR20010086520(A) 申请公布日期 2001.09.13
申请号 KR20000010445 申请日期 2000.03.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, JIN HO;CHO, IN SU
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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