发明名称 |
Method and arrangement for measuring temperature of a semiconductor component in an inactive state |
摘要 |
The present invention relates to a method and to arrangements for measuring temperature in an intermittently operating semiconductor. The method comprises the following steps:establishing that the semiconductor is in an inactive period;connecting a measuring circuit to the semiconductor;measuring a temperature-dependent electric quantity of the semiconductor component; andconverting the measured quantity to a temperature value that corresponds to the temperature of the semiconductor component.
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申请公布号 |
US6286996(B1) |
申请公布日期 |
2001.09.11 |
申请号 |
US19990397506 |
申请日期 |
1999.09.17 |
申请人 |
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL) |
发明人 |
MOLANDER MATS ERIK |
分类号 |
H03F1/30;H03F3/19;(IPC1-7):G01K1/02;G01K7/01 |
主分类号 |
H03F1/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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