| 摘要 |
PROBLEM TO BE SOLVED: To provide an inexpensive induced test device of a transformer capable of reducing an installation space, preventing generation of a noise, reducing power consumption, and shortening a starting time. SOLUTION: When a start switch 16 is switched to the ON state, a main circuit switch 2 is switched to the ON state, and an AC power supply is supplied to an inverter 5 through a blocking coil 4 for high frequency component reduction, and the inverter 5 produces a high frequency power source and supplies it to an voltage adjuster 7. When the output of the voltage adjuster 7 is boosted gradually from a zero voltage to a test voltage, the output voltage is applied on a high-voltage step-up transformer 9 through a selection switch 8, and boosted there, and the boosted voltage is applied on a secondary winding 11S of the transformer to be tested 11. In this case, primary winding 11P of the transformer to be tested 11 is opened. The voltage and the current at that time are detected by a voltage sensor 22 and a current sensor 23 and displayed on a voltmeter 13 and an ampere meter 14. After keeping the test voltage as long as prescribed test time, the voltage and the current and monitored by the voltmeter 13 and the ampere meter 14, to determine whether the transformer is in the normal state or not.
|
