发明名称 DENSE-PLASMA ETCHING OF INP-BASED MATERIALS USING CHLORINE AND NITROGEN
摘要 A semiconductor dry etching process that provides deep, smooth, and vertical etching of InP-based materials using a chlorinated plasma with the addition of nitrogen (N>2<) gas. Etching of InP-based semiconductors using an appropriate C1>2</N>2< mixture without any additional gases provides improved surface morphology, anisotropy and etch rates.
申请公布号 WO0165593(A1) 申请公布日期 2001.09.07
申请号 WO2001US06472 申请日期 2001.02.28
申请人 NANOVATION TECHNOLOGIES, INC.;NORTHWESTERN UNIVERSITY 发明人 PIERSON, THOMAS, E.;YOUTSEY, CHRISTOPHER, T.;HO, SENG-TIONG;PARK, SEOIJIN
分类号 H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址