DENSE-PLASMA ETCHING OF INP-BASED MATERIALS USING CHLORINE AND NITROGEN
摘要
A semiconductor dry etching process that provides deep, smooth, and vertical etching of InP-based materials using a chlorinated plasma with the addition of nitrogen (N>2<) gas. Etching of InP-based semiconductors using an appropriate C1>2</N>2< mixture without any additional gases provides improved surface morphology, anisotropy and etch rates.
申请公布号
WO0165593(A1)
申请公布日期
2001.09.07
申请号
WO2001US06472
申请日期
2001.02.28
申请人
NANOVATION TECHNOLOGIES, INC.;NORTHWESTERN UNIVERSITY