发明名称 MICROSTRUCTURE LINER HAVING IMPROVED ADHESION
摘要 A damascene structure, such as a conductive line or via, having a liner with a roughened surface between the substrate and the conductive fill and, preferably, a smooth bottom. The substrate underneath the liner may also have a roughened sidewall and smooth bottom. Such a structure provides enhanced adhesion between one or more layers of the damascene structure. The damascene structure may be manufactured by applying a photoresist over a substrate top surface, exposing the photoresist under conditions that create a standing wave in the resist, and developing the photoresist to provide a pattern having the desired roughened or serrated outline. The pattern is transferred into the substrate, the liner is applied over the substrate bottom and sidewalls, and the liner is filled with conductive material. A roughened liner surface may be achieved by applying a partial layer of liner material over the substrate, removing a portion of the partial layer, and repeating the application and removal steps.
申请公布号 US2001019884(A1) 申请公布日期 2001.09.06
申请号 US19990377329 申请日期 1999.08.18
申请人 MILLER JOHN A.;SIMON ANDREW;SLATTERY JILL;UZOH CYPRIAN E.;WANG YUN-YU 发明人 MILLER JOHN A.;SIMON ANDREW;SLATTERY JILL;UZOH CYPRIAN E.;WANG YUN-YU
分类号 H01L21/768;(IPC1-7):H01L21/476;H01L21/44;H01L21/31;H01L21/469;H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/768
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