| 摘要 |
A test device is disclosed having a base (22) that is a non-sample surface and sample structures (25 (a,b)) comprising pillars (20 (a,b)), wherein each pillar comprises a sample surface (24 (a,b)) and side surfaces (18 (a,b)), and wherein the sample surface (24 (a,b,)) of each pillar and the surface of the substrate (23) have the same coating. |
