发明名称 |
ERASE METHOD OF NON-VOLATILE SEMICONDUCTOR MEMORY |
摘要 |
PURPOSE: An erase method of a non-volatile semiconductor memory is provided to improve a tolerance characteristic by controlling deterioration of a tunnel oxide layer in each memory cell, and to shorten overall erase time by obviating the necessity of an erase program regarding a word line not having a memory cell to erase. CONSTITUTION: A scanning process is performed regarding each word line to determine whether a memory cell to erase is in the word line. If the memory cell to erase is not in the word line, an erase process is not performed regarding the memory cells in the word line. If the memory cell to erase is in the word line, memory cells in an erase state out of every memory cell in the word line are programmed. Every memory cell in the word line including the memory cell to erase is erased.
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申请公布号 |
KR20010083564(A) |
申请公布日期 |
2001.09.01 |
申请号 |
KR20000007309 |
申请日期 |
2000.02.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JUN SEONG |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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