发明名称 |
ELECTRIC CIRCUIT HAVING CIRCUIT COMPONENT AND TEST METHOD OF CIRCUIT COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To test surely a circuit component to be tested at minimum cost. SOLUTION: At least one circuit component can be tested independently of other circuit components, and data are not outputted into a bus during a test and/or other data are outputted into the bus instead of data outputted into the bus in usual operation.
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申请公布号 |
JP2001235518(A) |
申请公布日期 |
2001.08.31 |
申请号 |
JP20010017347 |
申请日期 |
2001.01.25 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
NYGREN AARON;PLAETTNER ECKEHARD;TAEUBER ANDREAS |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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