发明名称 |
PROGRAMMED-TEMPERATURE DESORPTION GAS ANALYZING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provided a programmed-temperature desorption analyzing device where the temperature of a sample surface and a control temperature in a thermocouple are equal to each other. SOLUTION: At least the upper portion of a sample stage 1 is formed out of a highly thermal conductive material, and a thermocouple 2 and the surface of a sample 4 are respectively brought into contact with the sample stage 1 to heat by thermal conduction and the difference in temperature from the sample stage 1 is removed.
|
申请公布号 |
JP2001235374(A) |
申请公布日期 |
2001.08.31 |
申请号 |
JP20000045838 |
申请日期 |
2000.02.23 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
HIROI HISAMI;KUROKAWA HIROSHI |
分类号 |
G01K1/14;G01K1/16;G01K7/02;G01N1/00;G01N1/22;G01N1/28;(IPC1-7):G01K1/14 |
主分类号 |
G01K1/14 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|