发明名称 PROGRAMMED-TEMPERATURE DESORPTION GAS ANALYZING DEVICE
摘要 PROBLEM TO BE SOLVED: To provided a programmed-temperature desorption analyzing device where the temperature of a sample surface and a control temperature in a thermocouple are equal to each other. SOLUTION: At least the upper portion of a sample stage 1 is formed out of a highly thermal conductive material, and a thermocouple 2 and the surface of a sample 4 are respectively brought into contact with the sample stage 1 to heat by thermal conduction and the difference in temperature from the sample stage 1 is removed.
申请公布号 JP2001235374(A) 申请公布日期 2001.08.31
申请号 JP20000045838 申请日期 2000.02.23
申请人 MITSUBISHI ELECTRIC CORP 发明人 HIROI HISAMI;KUROKAWA HIROSHI
分类号 G01K1/14;G01K1/16;G01K7/02;G01N1/00;G01N1/22;G01N1/28;(IPC1-7):G01K1/14 主分类号 G01K1/14
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