发明名称 Interconnect structure having improved resist adhesion
摘要 A method for use in patterning a conductive layer of an integrated circuit includes providing a conductive layer to be patterned and then forming a titanium nitride layer on the conductive layer. An oxide region is formed on the titanium nitride layer. A photoresist layer is formed on the oxide region for use in patterning the conductive layer. The oxide region may be formed by oxidation of the titanium nitride layer or by depositing an oxide layer on the titanium nitride layer.
申请公布号 US2001018257(A1) 申请公布日期 2001.08.30
申请号 US20010775178 申请日期 2001.02.01
申请人 MICRON TECHNOLOGY, INC. 发明人 MATHEWS VIJU K.
分类号 H01L21/3213;(IPC1-7):H01L21/20;H01L21/36 主分类号 H01L21/3213
代理机构 代理人
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