发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: To provide a method for manufacturing a semiconductor device for suppressing peeling of a layer becoming a mask material from a semiconductor substrate by obtaining the mask material of a desired size without changing a thickness of the material. CONSTITUTION: A polycrystal silicon film 2 and a tungsten silicide film 3 are formed on a silicon substrate 1. An insulating film to become a hard mask is formed on the film 3. A photoresist pattern 5 is formed on the insulating film. With the pattern 5 as a mask, the insulating film is anisotropically etched. A hard mask 4b is formed by etching the exposed side face of an insulating film 4a in a vapor phase hydrofluoric acid atmosphere.
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申请公布号 |
KR20010081947(A) |
申请公布日期 |
2001.08.29 |
申请号 |
KR20000061871 |
申请日期 |
2000.10.20 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KIMURA HAJIME |
分类号 |
H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):H01L21/32 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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