发明名称 SYSTEM AND METHOD FOR X-RAY EXAMINATION
摘要 PURPOSE: An X-ray examining system and a method thereof are provided to precisely and rapidly form a visual image, and to reduce cost. CONSTITUTION: To examine a material(3), an X-ray is generated from a scanning X-ray electronic tube(1) toward the material. The X-ray transmits the material to be formed on an upper surface of an image amplifying tube(5). The X-ray is transformed into a visual image for being formed on a visual image surface(6) at a lower surface of the image amplifying tube. Then, a control unit supplies a signal to a decoder to supply power to a transmitting area corresponding to the visual image. Thus, the image is formed on a CCD(Charge Coupled Device) camera(15). Herein, eight visual images are formed on the visual image surface. Therefore, eight transmitting areas are formed. Moreover, power is successively supplied to the transmitting areas to form the visual images on the CCD camera.
申请公布号 KR20010081570(A) 申请公布日期 2001.08.29
申请号 KR20000007377 申请日期 2000.02.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JU, HYO NAM;KIM, HYEONG CHEOL;KIM, YONG WON
分类号 G01N23/04;G21K1/04;G21K5/02;G21K5/10;H04N5/225;(IPC1-7):G01N21/00 主分类号 G01N23/04
代理机构 代理人
主权项
地址