发明名称 Disk drive testing
摘要 The invention includes a method and integrated circuit for testing a disk drive. The invention internally generates test inputs to the host interface in the disk drive. The test inputs emulate the actual inputs that a host computer would provide to the host interface. One version of the invention includes a drive control integrated circuit. The drive control integrated circuit comprises: a host interface, a processor, a buffer control, and compare circuitry. The processor processes test instructions to initiate a test pointer. The buffer control transfers commands from a buffer to the host interface in response to the pointer. The processor controls a write operation and a read operation in response to the commands. The compare circuitry compares the data block that is written to the address with another data block that is read from the address. The compare circuitry generates an alarm if the data blocks do not match.
申请公布号 US6282501(B1) 申请公布日期 2001.08.28
申请号 US19980175586 申请日期 1998.10.20
申请人 ADAPTEC, INC. 发明人 ASSOUAD NICOLAS C.
分类号 G11B19/02;G11B20/10;G11B27/36;(IPC1-7):G11B5/09 主分类号 G11B19/02
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