发明名称 Multi-layered coaxial interconnect structure
摘要 A method of forming a multi-layered interconnect structure is provided. A first conductive pattern is formed over an insulation layer. A first dielectric material is deposited over the first conductive pattern, and plugs are formed in the first dielectric material. A second conductive pattern is formed over the first dielectric material and plugs so as to form the multi-layered interconnect structure in part. Then, the first dielectric material is stripped away to leave the multi-layered interconnect structure exposed to air. A thin layer of second dielectric material is deposited so as to coat at least a portion of the interconnect structure. Next, a thin layer of metal is deposited so as to coat the at least a portion of the interconnect structure coated with the thin layer of second dielectric material. A third dielectric material is deposited over the interconnect structure to replace the stripped away first dielectric material.
申请公布号 US6281587(B1) 申请公布日期 2001.08.28
申请号 US20000522148 申请日期 2000.03.09
申请人 ADVANCED MICRO DEVICES, INC. 发明人 NOGAMI TAKESHI;LOPATIN SERGEY;PRAMANICK SHEKHAR
分类号 H01L21/768;(IPC1-7):H01L23/48;H01L21/476;H01L23/40;H01L23/52 主分类号 H01L21/768
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