发明名称 Laser programming of CMOS semiconductor devices using make-link structure
摘要 A CMOS semiconductor device is programmed by a laser beam which causes a PN junction in a silicon substrate to be permanently altered. This produces a leakage path between a program node and a tank region in the substrate; the program node can be an input to a transistor in a CMOS circuit, for example, so this node will always hold the transistor on or off depending whether or not it has been laser-programmed. Preferably, the tank region is of opposite type compared to the substrate, so the program node is electrically isolated from the substrate in either case.
申请公布号 US6281563(B1) 申请公布日期 2001.08.28
申请号 US19970846949 申请日期 1997.04.30
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WILLS KENDALL SCOTT;RODRIGUEZ PAUL A.
分类号 H01L21/8242;H01L23/525;(IPC1-7):H01L29/00 主分类号 H01L21/8242
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