发明名称 Method and apparatus for testing finite state machine (FSM) conformance utilizing unique input/output sequence (UIO) sets
摘要 Unique Input/Output Sequence (UIO) Sets are constructed to test conformance of a Machine (14) against a Finite State Machine (FSM) model (33). Unique Input/Output Sequence (UIO) Sets (63) uniquely identify FSM model states and may be Forward Unique I/O Sequences (FUIO), Backward Unique I/O Sequences (BUIO), Forward Unique I/O Sequence Sets (FUIOset), and/or Backward Unique I/O Sequence Sets (BUIOset). FSM model (33) state transitions are selected as Edges-Under-Test (EUT). A Set of EUT UIO Sets is identified comprising UIO Sets that uniquely identify either the source or destination FSM model (33) state of an EUT. One member is selected from the Set of EUT UIO Sets for a particular EUT, and each member of this UIO Set is concatenated with the EUT to form Test Subsequences (TS). These Test Subsequences are used to verify that the corresponding FSM transitions are successfully traversed by a Machine Under Test (MUT).
申请公布号 US6282681(B1) 申请公布日期 2001.08.28
申请号 US19950398831 申请日期 1995.03.06
申请人 MOTOROLA, INC. 发明人 SUN XIAO;HULL CARMIE A.
分类号 G01R31/3183;(IPC1-7):G06F11/00 主分类号 G01R31/3183
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