发明名称 AUTOMATIC ANALYZER AND AUTOMATIC ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an automatic analyzer of a type in which a carrying rack having a sample placed thereon is carried and measurement is advaced, and which enables the repeated measurement of the same item from the same sample vessel to be performed many times. SOLUTION: In this device, a new function of evaluation mode is added, so that a sample rack number 303 and a position number 304 can be added to the input information of measurement request in addition to a sample number 302, and the same sample rack number and the same position number can be also inputted to perform the repeated measurement of the same item from the same sample vessel. The same sample ID number 401 can be inputted to the input information of measurement request, so that the repeated measurement of the same item from the same sample vessel can be performed. In the input of measurement request, a plurality of requests for the same measurement item can be requested to one sample. A basic performance measurement such as simultaneous reproducibility or the like is instructed on a screen for displaying a basic performance measurement item.
申请公布号 JP2001228158(A) 申请公布日期 2001.08.24
申请号 JP20000046776 申请日期 2000.02.18
申请人 HITACHI LTD;HITACHI SCI SYST LTD 发明人 KIKUCHI TAKAHIRO;MIMURA TOMONORI;HATTORI MITSUO;HAYASHI MASAMI;USUI SHINOBU;OTAKI TOMOMASA;SAITO NAOKO
分类号 G01N35/02;(IPC1-7):G01N35/02 主分类号 G01N35/02
代理机构 代理人
主权项
地址