发明名称 Method of manufacturing a double-heterojunction bipolar transistor on III-V material
摘要 The invention relates to a method of manufacturing a double heterojunction bipolar transistor (1) comprising successively at least one sub-collector layer, a collector layer, a base layer and a metallic layer (10) deposited on the said base layer; the said metallic layer (10) being extended towards a contact pad (110) of the base by an underetched metallic "air bridge" (100), characterized in that producing the said "air bridge" (100) includes the following steps: effecting a first localized etching under the said bridge, this first etching being selective so as to etch the sub-collector layer laterally; and effecting a second localized etching under the said bridge, this second etching being selective so as to vertically etch at least the collector layer.
申请公布号 US2001015474(A1) 申请公布日期 2001.08.23
申请号 US20010781275 申请日期 2001.02.13
申请人 BLAYAC SYLVAIN;RIET MURIEL;BERDAGUER PHILIPPE 发明人 BLAYAC SYLVAIN;RIET MURIEL;BERDAGUER PHILIPPE
分类号 H01L21/331;H01L21/768;H01L23/522;H01L29/423;H01L29/737;(IPC1-7):H01L21/331;H01L21/822;H01L27/082;H01L27/102;H01L29/70;H01L31/11 主分类号 H01L21/331
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