发明名称 METHOD FOR MANUFACTURING Si-SiC MEMBER FOR SEMICONDUCTOR HEAT TREATMENT
摘要 A method intended for manufacturing an Si-SiC member for a semiconductor heat treatment and suited for heat treatment of a semiconductor wafer of a large diameter while minimizing the contamination of the semiconductor wafer. Further disclosed is a method for manufacturing an Si-SiC member for a semiconductor heat treatment, in which any slip occurs while minimizing the contamination of the semiconductor wafer. The method comprises a first step of kneading SiC powder having a total content of metal impurity of 0.2 ppm or less with a molding assistant, a second step of forming a molded piece from the kneaded material, a third step of calcinating the molded piece, a fourth step of purifying the calcinated body, and a fifth step of impregnating the purified body with silicon in a closed vessel disposed in a heating furnace.
申请公布号 WO0160764(A1) 申请公布日期 2001.08.23
申请号 WO2000JP00840 申请日期 2000.02.15
申请人 TOSHIBA CERAMICS CO., LTD.;HORIUCHI, YUSHI;KUROI, SHIGEAKI 发明人 HORIUCHI, YUSHI;KUROI, SHIGEAKI
分类号 C04B35/573;C04B41/50;C04B41/52;C04B41/85;C04B41/89;H01L21/673;(IPC1-7):C04B41/85;C04B41/88;H01L21/205;C23C16/32 主分类号 C04B35/573
代理机构 代理人
主权项
地址