发明名称 SEMICONDUCTOR IC CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor IC circuit which accomplishes a BIST(built in self test), whitout having to provide an exclusive test terminal. SOLUTION: The semiconductor IC circuit is provided with a CPU 11 (central processing unit) to execute a prescribed program, a memory 12 to store the program, data and the like, a logic circuit 13 which performs logic operations, a BIST circuit 14 which performs BIST, a reset terminal 15 to receive a reset signal from the outside, a clock terminal 16 to receive a clock signal from the outside, and an output terminal 17 to output a signal to the outside. The BIST circuit 14 receives the reset signal from outside through the reset terminal 15, and the operation thereof is controlled by the reset signal.
申请公布号 JP2001221831(A) 申请公布日期 2001.08.17
申请号 JP20000028367 申请日期 2000.02.04
申请人 SEIKO EPSON CORP 发明人 HIOKI SHUJI
分类号 G01R31/28;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/28
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