发明名称 SPECTRALLY SHAPED X-RAY INSPECTION SYSTEM
摘要 <p>A system and methods for non-invasive x-ray inspection of an enclosure in such a manner as to reduce the ambient radiation dose to below a specified level. A beam spectrally filtered to emphasize a high-energy component of penetrating radiation is interleaved, temporally, with a beam dominated by a low-energy component. Thus both lightly loaded and heavily loaded cargo may be inspected while limiting the ambient scattered radiation.</p>
申请公布号 WO2001059485(A1) 申请公布日期 2001.08.16
申请号 US2001004143 申请日期 2001.02.09
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