发明名称 SPECTRALLY SHAPED X-RAY INSPECTION SYSTEM
摘要 A system and methods for non-invasive x-ray inspection of an enclosure in such a manner as to reduce the ambient radiation dose to below a specified level. A beam spectrally filtered to emphasize a high-energy component of penetrating radiation is interleaved, temporally, with a beam dominated by a low-energy component. Thus both lightly loaded and heavily loaded cargo may be inspected while limiting the ambient scattered radiation.
申请公布号 WO0159485(A1) 申请公布日期 2001.08.16
申请号 WO2001US04143 申请日期 2001.02.09
申请人 AMERICAN SCIENCE AND ENGINEERING, INC. 发明人 GRODZINS, LEE;ROTHSCHILD, PETER
分类号 G01N23/02;G01N23/20;G01V5/00;(IPC1-7):G01V5/00 主分类号 G01N23/02
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