发明名称 Etching method for doped polysilicon layer
摘要 A method for etching a doped polysilicon layer. A first doped polysilicon layer of a first conductive type and a second doped polysilicon layer of a second conductive type are formed. An etching process is performed to pattern the first doped polysilicon layer and the second doped polysilicon layer. The etching process includes a first main etching step and a second main etching step. The etching pressure of the first main etching step is lower than the etching pressure of the second main etching step.
申请公布号 US6274503(B1) 申请公布日期 2001.08.14
申请号 US19990241757 申请日期 1999.02.01
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSIEH CHI-KUO
分类号 H01L21/3213;H01L21/8238;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/3213
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