ESTIMATING METHOD AND ESTIMATING DEVICE FOR SOFTWARE ERROR RESISTANCE OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a simple method for estimating the rate of software errors of a semiconductor device relative to cosmic ray neutrons. SOLUTION: The spectrum of cosmic ray neutrons is divided. The software errors are weighted by flux in each of divisional energy bands generated when the semiconductor device is irradiated with neutrons of typical energy. The total cross-section of the weighted software errors is used to forecast the rate of software errors undergone by the semiconductor device in an actual environment.