发明名称 METHOD FOR REMOVING IMPURITY INSIDE OF SEMICONDUCTOR CHAMBER AND APPARATUS FOR REMOVING IMPURITY
摘要 PURPOSE: A method for removing an impurity inside of a semiconductor chamber and an apparatus for removing the impurity are provided to remove impurity particles by using heated chamber and high-temperature gas. CONSTITUTION: The impurity removing method includes following steps. At first, the gas stored in a gas box is passed by a gas heater(21) to produce gases at high temperature. Then, the chamber is directly heated by using a chamber heater(31) provided with a chamber head. At third, the high temperature gas inhaled in the chamber head burns the impurities inside the chamber. At forth, the impurities is drained outside by a pump. At last, the preceding steps are performed repeatedly to remove the impurities in the chamber.
申请公布号 KR20010074029(A) 申请公布日期 2001.08.04
申请号 KR20000083872 申请日期 2000.12.28
申请人 WORLD SEMI CO., LTD. 发明人 OH, HAK SU
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
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