| 摘要 |
PURPOSE: A semiconductor memory test device is provided to perform a memory test only using power of a main power supply or a power supply for test by including a separate power supply for test. CONSTITUTION: In a semiconductor memory test device, a power supply(150) for test is provided to supply a power source for test to a semiconductor memory apart from the power source supplied from a main power supply of a computer apparatus. A switching board(160) supplies one of the power source applied from the power supply for test and the power source applied from the main power supply through a desired socket(120) for testing the semiconductor memory, to the semiconductor memory selectively.
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