发明名称 FINE PARTICLE MEASURING DEVICE, FINE PARTICLE COLLECTING DEVICE, AND FINE PARTICLE ANALYZING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a fine particle measuring device for measuring the density (number) or the like of fine particles for each particle diameter at high sensitivity, a fine particle collecting device for collecting the monodisperse fine particles classified according to particle diameter onto a substrate or the like with efficiency in a uniform distribution of fine particle densities, and a fine particle analyzing device for analyzing with high accuracy the composition, structure, physical properties and the like of the fine particles collected on the substrate or the like. SOLUTION: In DMA 2, fine particles contained in an aerosol are classified according to particle diameter based on their electric mobility. After classification the aerosol is introduced into an aerodynamic lens 3 through a valve 13 and the fine particles contained in the aerosol are concentrated into a fine-particle beam B, which is then introduced into a vacuum chamber 5 through a nozzle 4. Thus, only the fine particles focused by the nozzle 4 propagate downward in the form of the fine-particle beam B. The fine particles (fine-particle beam B) separated by the aerodynamic lens 3 and the nozzle 4 are introduced into a high vacuum chamber 12 through the vacuum chamber 5 or the like to perform measurement, collection, analysis and the like of the fine particles inside the high vacuum chamber 12.
申请公布号 JP2001208673(A) 申请公布日期 2001.08.03
申请号 JP20000020722 申请日期 2000.01.28
申请人 INST OF PHYSICAL & CHEMICAL RES 发明人 SETSU KOSHU;OKADA YOSHIKI;TAKEUCHI KAZUO
分类号 G01N15/02;(IPC1-7):G01N15/02 主分类号 G01N15/02
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