发明名称 SCATTERED X-RAY TYPE DEFECT DETECTOR, AND X-RAY DETECTOR
摘要 PROBLEM TO BE SOLVED: To accurately detect the defects of concrete of a tunnel. SOLUTION: Beam-like X-rays X(11) formed by passing X-ray generated by an X-ray generator 20 through pin poles PH1, PH2 are allowed to be incident on an object to be inspected (concrete) 100 to generate back scattering X-rays X(12). The back scattering X-rays X(12) pass through a circular slit 33 to be incident on the inner peripheral surface of an X-ray detection apparatus 40. X-ray detectors are arranged to the X-ray detection apparatus 40 in an annular state and the back scattering X-rays X(12) are detected by a large number of these detectors. The X-ray detectors have resolving power in the depth direction and, when the back scattering X-rays X(12) are not detected at a part in the depth direction, the X-ray detectors detect the presence and position of a defect 101.
申请公布号 JP2001208705(A) 申请公布日期 2001.08.03
申请号 JP20000018212 申请日期 2000.01.27
申请人 MITSUBISHI HEAVY IND LTD 发明人 TEJIMA KAZUNORI;NOMURA SHINJI;WAKAMOTO IKUO
分类号 G01N23/203;G01T1/20;G01T1/29;G01T7/00;G21K1/00;G21K1/02;(IPC1-7):G01N23/203 主分类号 G01N23/203
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