Testverfahren für einen Datenspeicher

摘要

The invention relates to a test method for testing a data memory which comprises a main data memory (2) with a plurality of data memory units. According to the inventive method, the following steps are carried out for all data memory units: (a) addressing a data memory unit by applying the address of the data memory unit to a data bus linked with the main data memory (2); (b) applying the input test data for testing the addressed data memory unit to a data bus linked with the main data memory (2); (c) reading out the read-out test data from the addressed data memory unit; (d) comparing the output test data with the expected scheduled output test data; (e) writing the applied address into an address memory unit of an address memory (5) and the expected scheduled output test data into a pertaining redundancy data memory unit of a redundancy data memory (6) if the output test data and the expected scheduled output test data do not correspond.