发明名称 Semiconductor device having impurity regions with varying impurity concentrations
摘要 In an access transistor formed on a silicon substrate, its drain region is formed of n- type and n+ type drain regions and its source region is formed of n- type and n+ type source regions. In a driver transistor, its source region is formed of n- type and n++ type source regions and its drain regions is formed of n- type and n+ type drain regions. The n+ +type source region is formed deeper than the n+ type drain region. Accordingly, a semiconductor device ensuring improvement in a static noise margin while suppressing increase in manufacturing cost is provided.
申请公布号 US6268627(B1) 申请公布日期 2001.07.31
申请号 US19980198611 申请日期 1998.11.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ISHIGAKI YOSHIYUKI;FUJII YASUHIRO
分类号 H01L21/8244;H01L27/11;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/8244
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