发明名称 |
Semiconductor device having impurity regions with varying impurity concentrations |
摘要 |
In an access transistor formed on a silicon substrate, its drain region is formed of n- type and n+ type drain regions and its source region is formed of n- type and n+ type source regions. In a driver transistor, its source region is formed of n- type and n++ type source regions and its drain regions is formed of n- type and n+ type drain regions. The n+ +type source region is formed deeper than the n+ type drain region. Accordingly, a semiconductor device ensuring improvement in a static noise margin while suppressing increase in manufacturing cost is provided.
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申请公布号 |
US6268627(B1) |
申请公布日期 |
2001.07.31 |
申请号 |
US19980198611 |
申请日期 |
1998.11.24 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
ISHIGAKI YOSHIYUKI;FUJII YASUHIRO |
分类号 |
H01L21/8244;H01L27/11;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 |
主分类号 |
H01L21/8244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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