发明名称 Verfahren zum Vereinzeln eines Wafers
摘要 In a method of dicing a wafer, which comprises a plurality of individual circuit structures, a trench is first defined between at least two circuit structures on one face of the wafer. Subsequently, the trench is deepened down to a defined depth. Following this, one face of the wafer has fixed thereto a re-detachable intermediate support composed of a fixed intermediate support substrate and an adhesive medium which is applied to said intermediate support substrate and which can specifically be modified in terms of its adhesive strength, whereupon the wafer is dry-etched from the opposite face so that circuit chips are obtained which are connected to one another only via the intermediate support. Subsequently, the circuit chips are removed from the intermediate support. This method substantially reduces mechanical impairments that may occur during dicing of the circuit chips; on the one hand, this permits the production of circuit chips with a thickness of less than 50 mum and, on the other hand, it leads to mechanically substantially undamaged circuit chips.
申请公布号 DE19962763(C2) 申请公布日期 2001.07.26
申请号 DE1999162763 申请日期 1999.12.23
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 KLUMPP, ARMIN;HACKER, ERWIN;FEIL, MICHAEL;LANDESBERGER, CHRISTOF
分类号 H01L21/301;H01L21/68;H01L21/78;H01L21/782;H01L21/98;H01L25/065;(IPC1-7):H01L21/78;H01L21/304 主分类号 H01L21/301
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