发明名称 MOS-TRANSISTOR STRUCTURE WITH A TRENCH-GATE ELECTRODE AND A REDUCED SPECIFIC CLOSING RESISTOR AND METHODS FOR PRODUCING AN MOS TRANSISTOR STRUCTURE
摘要 The invention relates to an MOS transistor structure with a trench gate electrode and a reduced specific closing resistor. The integral of the doping concentration of the body region in the lateral direction between two adjacent drift regions is greater than or equal to the integral of the doping concentration in a drift region in the same lateral direction. The invention also relates to methods for producing an MOS transistor structure. Body regions and drift regions are produced by means of epitaxic growth and implantation, repeated epitaxic growth or by filling trenches with doped conduction material.
申请公布号 WO0057481(A3) 申请公布日期 2001.07.26
申请号 WO2000DE00621 申请日期 2000.03.01
申请人 INFINEON TECHNOLOGIES AG;HIRLER, FRANZ;WERNER, WOLFGANG 发明人 HIRLER, FRANZ;WERNER, WOLFGANG
分类号 H01L21/336;H01L29/06;H01L29/10;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址