发明名称 |
APPARATUS AND METHOD FOR MEASURING INTERMOLECULAR INTERACTIONS BY ATOMIC FORCE MICROSCOPY |
摘要 |
<p>A sample support member for atomic force microscopy of intermolecular interactions includes a sample support base having a plurality of protrusions, each protrusion having an apical substrate region or tip that has been chemically modified by the immobilization thereon of a sample compound or of a linking compound that is capable of binding a sample compound. A reference compound support member has a surface region having at least one reference compound immobilized thereon. The relative position and orientation of the reference compound support member and the substrate support member are controlled to select a particular protrusion and to cause an interaction between a reference compound immobilized on the surface region of the free end of the cantilever and the sample compound immobilized on the apical substrate area of the selected protrusion. A physical parameter associated with the interaction between the reference compound and the sample compound can be measured.</p> |
申请公布号 |
EP1076803(A4) |
申请公布日期 |
2001.07.25 |
申请号 |
EP19990922782 |
申请日期 |
1999.05.05 |
申请人 |
THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE NAVY |
发明人 |
DEVAULT GREEN, JOHN-BRUCE;LEE, GIL, U. |
分类号 |
G01B21/30;G01B5/00;G01B5/30;G01Q30/02;G01Q60/24;G01Q60/42;(IPC1-7):G01B5/00 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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