发明名称 POLISHING DEVICE AND POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a polishing device and a polishing method suitable for flattening the surface of the work to be processed at a controlled temperature by a chemical and mechanical polishing(CMP) method. SOLUTION: A fluid pressure in a first passage 13 to supply the fluid 11 to a space 14 is kept bigger than a fluid pressure in a second passage 15 to discharge the fluid from the space 14 by using a polishing tool 100 having the space 14 formed so as to make contact with a polishing pad 1 through an elastic body 2 in a polishing pad holder 5. The flow of the fluid is produced in the space 14 and the fluid pressure in the space 14 is practically kept at a designated value by supplying the fluid to the space 14 and discharging it from the space 14. The polishing pad 1 is pressed onto a work by transmitting the fluid pressure in the space 14 to the polishing pad 1 through the elastic body 2, and the polishing pad 1 is moved relatively to the work while controlling the temperature of the fluid supplied to the space 14, in order to grind the work.
申请公布号 JP2001198801(A) 申请公布日期 2001.07.24
申请号 JP20000012931 申请日期 2000.01.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAWA TOMOHIRO;KANESHIMA KEINOSUKE;SHINGU KATSUKI
分类号 B24B37/005;B24B37/015;H01L21/304 主分类号 B24B37/005
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