发明名称 GETTER DEVICE FOR ELECTRON TUBE AND METHOD OF THE SAME, AND ELECTRON TUBE USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a getter device for electron tube, in which the quality and reliability of the electron tube are improved by using a getter device which substantially controls an ion shock to a large-sized electron tube or CDT using, for example, an impregnation type cathode. SOLUTION: This getter device is a getter device for electron tube having getter material including a Ba-Al alloy powder and an Ni powder filled in a metallic getter vessel. The getter material has partial pressures of argon and nitrogen of 10-5 Pa or below in a gas released during getter flashing. Also, the partial pressure of a carbon-containing gas in the gas released during getter flashing is set up at 10-3 Pa or below. After filling into the metallic getter vessel, the getter material is previously subjected to high-frequency induction heating in vacuo for 30 seconds or shorter at a temperature of 700 to 800 deg.C.</p>
申请公布号 JP2001195976(A) 申请公布日期 2001.07.19
申请号 JP20000005706 申请日期 2000.01.06
申请人 TOSHIBA CORP 发明人 OKAI TADAKI
分类号 H01J9/39;H01J7/18;H01J29/94;(IPC1-7):H01J7/18 主分类号 H01J9/39
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