发明名称 ARRAY SUBSTRATE AND ITS INSPECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an array substrate whose cost is capable of being reduced without lowering the measuring accuracy of a circuit for inspection and an inspection method which is an inspection method inspecting short circuits and disconnection of a display device capable of making pixels to be highly accurate and is capable of being applied to the array substrate. SOLUTION: A first signal line X1 and a second signal line X2 which are adjacent with each other are made to be a pair and the first probe PR1 of a circuit for inspection 900 is connected to a connection pad PD1A and, also, a second probe PR2 is connected to a pad for inspection PD1B which is provided on the signal line X2. Then, the short circuit between the signal lines of the pair is detected by writing an anolog signal to the first signal line X1 in a state in which the connection pad PD1A connected to the first probe PR1 is connected electrically to the first signal line X1 by the control of a switch SW1 which is included in a selection circuit 170 and by reading out an output signal from the second signal line X2 connected electrically to the pad for inspection PD1B.</p>
申请公布号 JP2001195034(A) 申请公布日期 2001.07.19
申请号 JP20000003616 申请日期 2000.01.12
申请人 TOSHIBA CORP 发明人 WATANABE RYOICHI;SEIKI MASAHIRO;MATSUNAGA IKUO
分类号 G09G3/36;G01R31/02;G02F1/13;G02F1/136;G02F1/1368;G09F9/00;G09G3/20;(IPC1-7):G09G3/20 主分类号 G09G3/36
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