发明名称 Advanced process control for semiconductor manufacturing
摘要 An Advanced Process Control (APC) Framework performs automatic process control operations through the design and development of a software framework that integrates factory, process, and equipment control systems. The APC Framework benefits semiconductor-manufacturing factories, or "fabs," throughout the development of the APC Framework by using an iterative development approach. The APC Framework is designed to integrate seamlessly with commercially-available APC tools. The APC Framework specifies components and a component structure that enable multiple vendors to build and sell framework-compatible products using an open architecture that accommodates plug-and-play components. The APC Framework advantageously increases product yield distributions and equipment utilization, and lowers defect densities.
申请公布号 US6263255(B1) 申请公布日期 2001.07.17
申请号 US19980080620 申请日期 1998.05.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 TAN HENG-WEI OSBERT;VINES, JR. DONALD H.
分类号 G05B19/418;G06F19/00;(IPC1-7):G06F19/00 主分类号 G05B19/418
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