| 摘要 |
Conformance testing apparatus for testing the consumption of an electronic component in a testing machine. The apparatus includes a power supply circuit having current-measuring circuitry for measuring the current taken, a test sequencer, and a measurement sequencer in which each row contains a measurement flag representative of a command to perform or not to perform a current measurement. The measurement sequencer includes a multiple acquisition memory in which each acquisition row corresponds to a row of the measurement sequence whose measurement flag is positive. The memory includes, for each acquisition row, at least one limit value zone in which a limit value for the current is written, and at least one conformance zone in which a conformance flag is written representative of the result of a comparison between the current as measured and the limit value. |
